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Analysis of Pb dopant distributions in KCl monocrystals by energy dispersive X‐ray spectrometry
Author(s) -
Krajewski Th.,
Malicskó L.
Publication year - 1983
Publication title -
crystal research and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0232-1300
DOI - 10.1002/crat.2170180222
Subject(s) - microanalysis , dopant , analytical chemistry (journal) , scanning electron microscope , foil method , aluminium , chemistry , matrix (chemical analysis) , mass spectrometry , aluminium foil , materials science , mineralogy , doping , metallurgy , chromatography , composite material , optoelectronics , organic chemistry , layer (electronics)
The energy dispersive X‐ray microanalysis in combination with the scanning electron microscopy was used for investigations of the microdistribution of Pb dopants in solution‐grown KCl crystals. In applying an absorption filter technique (using an about 30 μm thick aluminium foil arranged into the X‐ray path between the specimen and the detector) the resulting detectability of the Pb minor constituents is improved by a factor of about 3. The minimum detectable content of lead within the KCl matrix could be estimated to have the order of magnitude of 0.1 mole per cent Pb.