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On the morphology of the unidirectionally solidified AgSi eutectic alloy
Author(s) -
Chrost Krystal,
Frühauf Joachim,
Schmidt Günther
Publication year - 1983
Publication title -
crystal research and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0232-1300
DOI - 10.1002/crat.2170180108
Subject(s) - eutectic system , morphology (biology) , alloy , materials science , crystallography , metal , eutectic bonding , temperature gradient , metallurgy , composite material , chemistry , physics , geology , paleontology , quantum mechanics
It is known that the structure of anormal eutectics occurring in the systems metal‐Si, metal‐Ge strongly depends on the conditions of growth ‐ that is, on the solidification rate R and the temperature gradient G . Structures occurring in the unidirectionally solidified AgSi eutectic alloy with morphology corresponding to region B according to classification adopted by H ELLAWELL for the system AlSi were investigated. For the description of the morphology, three parametres were adopted: λ ‐ distance between the centres of Si crystals, d ‐ length of arms of cross‐like crystals, b ‐ thickness of Si plates. It has been found that at similar morphologies of Si crystals, expressed by constant values of the relation λ d , the known relation λ 2 R = const. is fulfilled, too.