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An X‐ray diffraction refinement of the structure of natural thomsonite
Author(s) -
Pechar FrantiŠek
Publication year - 1982
Publication title -
crystal research and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0232-1300
DOI - 10.1002/crat.2170170912
Subject(s) - orthorhombic crystal system , crystallography , diffraction , x ray , bond length , x ray crystallography , chemistry , materials science , analytical chemistry (journal) , crystal structure , optics , physics , chromatography
Thomsonite Na 2 Ca 4 Al 10 Si 10 O 40 , orthorhombic Pncn, a = 1.3124 nm, b = 1.3078 nm, c = 0.662 nm, V = 1.1369 nm 3 , Z = 2, D m = 2.30, D c = 2.26, μ = 12.4 cm −1 . The average length of the bond T–O = 0.1685 nm. The final R ‐value for 456 independent observed reflections is 0.085.
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