Premium
Applicability of the Method of VAN DER P AUW to Samples with Two‐dimensional Defects
Author(s) -
Albers C.,
Gertig H.,
Reuter M.
Publication year - 1982
Publication title -
crystal research and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0232-1300
DOI - 10.1002/crat.2170170506
Subject(s) - van der pauw method , cleavage (geology) , conductivity , chemistry , hall effect , analytical chemistry (journal) , condensed matter physics , electrical resistivity and conductivity , materials science , physics , chromatography , composite material , quantum mechanics , fracture (geology)
The influence of cleavage steps and low angle boundaries on the results of conductivity and Hall measurements by Van der Pauw's method are investigated and some criterions for evidence of sample inhomogeneities by the assumption of symmetrical sample shape and contact arrangement formulated. Hall voltage is less influenced by cleavage steps, so that the determination of carrier concentration is nearly correct also in strongly disturbed samples. Conductivity and carrier mobility measurements in the usus usual calculation procedure will lead to considerable errors. By one pair of contacts only for conductivity as well as for Hall measurements, the influences of inhomogeneities cannot be distinguished from volume effects of the sample.