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On some problems of the characterization of GGG (Gd 3 Ga 5 O 12 ) substrates for memory elements
Author(s) -
Meier D.,
Michalowsky L.
Publication year - 1982
Publication title -
crystal research and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0232-1300
DOI - 10.1002/crat.2170170216
Subject(s) - characterization (materials science) , materials science , bubble , nanotechnology , chemical engineering , mineralogy , optoelectronics , computer science , chemistry , engineering , parallel computing
Causes for defects in crystal growth and those due to preparation are described with regard to requirements to GGG substrates used in bubble memory chips. Origin, proof, and avoidance of said defects are discussed.