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Highly Accurate Thickness Determination of 2D Materials (Crystal Research and Technology 6/2021)
Publication year - 2021
Publication title -
crystal research and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0232-1300
DOI - 10.1002/crat.202170020
Subject(s) - section (typography) , crystal (programming language) , citation , enhanced data rates for gsm evolution , measure (data warehouse) , cover (algebra) , computer science , histogram , information retrieval , library science , image (mathematics) , data mining , artificial intelligence , mechanical engineering , engineering , programming language , operating system
In article number 2100056, Mario Lanza and co‐workers report that the method most widely used to measure the thickness of 2D materials, which consists of measuring a topographic map with atomic force microscopy at the edge and plotting a cross section at a random location, is inaccurate. Plotting the histogram height of the topographic map is demonstrated to be much more reliable.

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