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Crystal Growth of Materials with the ThCr 2 Si 2 Structure Type
Author(s) -
Kliemt Kristin,
Peters Marius,
Feldmann Fabian,
Kraiker Alexej,
Tran DoanMy,
Rongstock Susanna,
Hellwig Johannes,
Witt Sebastian,
Bolte Michael,
Krellner Cornelius
Publication year - 2020
Publication title -
crystal research and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0232-1300
DOI - 10.1002/crat.201900116
Subject(s) - intermetallic , magnetization , crystallography , crystal structure , electrical resistivity and conductivity , lanthanide , crystal (programming language) , photoemission spectroscopy , rare earth , ferromagnetism , materials science , type (biology) , perpendicular , chemistry , condensed matter physics , x ray photoelectron spectroscopy , mineralogy , nuclear magnetic resonance , magnetic field , metallurgy , physics , geometry , alloy , ion , computer science , quantum mechanics , programming language , organic chemistry , mathematics , ecology , biology
The single crystal growth of 19 different intermetallic compounds within the LnT 2 X 2 family (with Ln = lanthanides, T = Co, Ru, Rh, Ir, and X = Si, P) is presented, by employing a high‐temperature metal‐flux technique. The habitus of the obtained crystals is platelet‐like with the crystallographic c direction perpendicular to the surface and with individual masses between 1 and 100 mg. The magnetic properties of these crystals are characterized by magnetization, heat‐capacity, and resistivity measurements. These crystals form the materials basis for a thorough study of exciting surface properties by angle‐resolved photoemission spectroscopy.
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