Premium
X‐Ray Topography: X‐Ray Topography Characterization of the Bridgman‐Grown Crystals of Zinc Germanium Phosphide (Crystal Research and Technology 11/2018)
Publication year - 2018
Publication title -
crystal research and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0232-1300
DOI - 10.1002/crat.201870020
Subject(s) - phosphide , germanium , crystal (programming language) , x ray , indium phosphide , characterization (materials science) , new england , crystallography , materials science , optics , nanotechnology , chemistry , physics , computer science , optoelectronics , silicon , metal , political science , metallurgy , law , programming language , gallium arsenide , politics
X‐ray image of the zinc germanium phosphide crystal obtained at the synchrotron radiation using the rocking topography technique. More details can be found in article number 1800154 by Alexander A. Kaloyan, Konstantin M. Podurets, and co‐workers.