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Thin Films: The Evolution of Growth, Crystal Orientation, and Grain Boundaries Disorientation Distribution in Gold Thin Films (Crystal Research and Technology 8/2018)
Publication year - 2018
Publication title -
crystal research and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0232-1300
DOI - 10.1002/crat.201870014
Subject(s) - orientation (vector space) , crystallite , crystal (programming language) , grain boundary , crystallography , materials science , electron diffraction , electron backscatter diffraction , diffraction , transmission electron microscopy , thin film , optics , nanotechnology , physics , chemistry , computer science , geometry , mathematics , microstructure , programming language
This image presents the summary of electron microscopy characterization of thin films. Top figure represents the selected area electron diffraction pattern displaying crystallographic information of each crystallite in reciprocal space. Transmission electron micrograph, and crystal orientation map obtained by the detailed analysis of the diffraction pattern acquired by the precessed electron beam of each section of the sample with a spatial resolution of 1 nm are presented in bottom figures. Each color in orientation map represents the unique orientation of the corresponding grain. This is reported by Prakash Parajuli, Miguel José Yacamán and co‐workers in article number 1800038 .