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Incorporation of hafnium (IV) into KTP framework from phosphate‐fluoride fluxes
Author(s) -
Zatovsky Igor V.,
Slobodyanik Nikolay S.,
Ivanenko V. I.,
Oseledchik Yu. S.,
Letsenko V. Yu.,
Ushchapivska Tetiana I.
Publication year - 2016
Publication title -
crystal research and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0232-1300
DOI - 10.1002/crat.201500268
Subject(s) - absorption edge , absorption (acoustics) , fluoride , absorption spectroscopy , hafnium , crystal (programming language) , ion , phosphate , doping , diffraction , crystal structure , wavelength , chemistry , materials science , analytical chemistry (journal) , crystallography , inorganic chemistry , optoelectronics , optics , zirconium , band gap , physics , organic chemistry , chromatography , computer science , composite material , programming language
Solid solutions KTi 1‐X Hf X OPO 4 (х = 0.008 – 0.107) possessing the KTiOPO 4 structure, have been synthesized in molten system K 2 O‐P 2 O 5 ‐TiO 2 ‐HfF 4 . The crystal growth experiment of Hf‐doped KTP crystal has been reported. The X‐ray powder diffraction data and chemical analysis are also presented. It has been shown that KTiOPO 4 crystal structure slightly changes when Hf incorporates into the framework. Transmission/absorption spectra of KTi 0.974 Hf 0.026 OPO 4 crystals have been recorded. The incorporation of Hf ions shifts the optical absorption edge in the UV‐visible spectrum towards the long‐wavelength region with absorption near 387 nm.