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Cover Picture: Crystal Research and Technology 4'2014
Publication year - 2014
Publication title -
crystal research and technology
Language(s) - English
Resource type - Reports
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0232-1300
DOI - 10.1002/crat.201470006
Subject(s) - electron backscatter diffraction , crystal (programming language) , diffraction , correlation , cover (algebra) , citation , computer science , crystallography , physics , optics , library science , mathematics , chemistry , geometry , engineering , mechanical engineering , programming language
The image background depicts an electron backscatter diffraction (EBSD) pattern of a Si monocrystal. The shifts of the band crossings in such patterns as evaluated by means of cross correlation or alternatively phase‐only correlation allow to determine elastic distortion variations as small as ∼10 ‐4 in strain and rotation. Thomas Riedl and Horst Wendrock report on page 195 that the cross correlation procedure exhibits a higher robustness against noise effects as compared to the phase‐only variant.