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The new JEOL JEM‐ARM200CF at the University of Illinois at Chicago
Author(s) -
Klie R. F.,
Gulec A.,
Guo Z.,
Paulauskas T.,
Qiao Q.,
Tao R.,
Wang C.,
Low K. B.,
Nicholls A. W.,
Phillips P. J.
Publication year - 2014
Publication title -
crystal research and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0232-1300
DOI - 10.1002/crat.201300200
Subject(s) - characterization (materials science) , scanning transmission electron microscopy , image resolution , materials science , microscope , dark field microscopy , field (mathematics) , optics , nanotechnology , transmission electron microscopy , microscopy , physics , mathematics , pure mathematics
A multitude of characterization techniques that can be applied across a wide range of length scales and to a variety of materials are available on modern scanning transmission electron microscopes (STEM). In 2011, such an instrument was installed at the University of Illinois at Chicago: the aberration‐corrected cold‐field emission JEOL JEM‐ARM200CF, capable of atomic‐resolution imaging and spectroscopy in a temperature range between 80–1300 K. This paper will review a number of studies focusing on both structural and chemical characterization of materials including NbH, SrTiO 3 , Pt catalysts and Al x Ga 1– x N nanowires. Microscope versatility, a central theme of this work, is realized through the ability to perform fine‐scale chemical characterization while retaining high spatial resolution. Of particular interest to many studies is the visualization of light elements, such as N, O or H, using simultaneous high‐angle annular dark‐field (HAADF) and annular bright‐field (ABF) imaging.