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Structure and morphological stability of (Lu 1– x Eu x ) 2 O 3 thin films
Author(s) -
Bezkrovnyi O. S.,
Babayevskaya N. V.,
Mateychenko P. V.,
Vovk O. M.,
Doroshenko A. G.,
Sofronov D. S.
Publication year - 2014
Publication title -
crystal research and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0232-1300
DOI - 10.1002/crat.201300091
Subject(s) - thermogravimetric analysis , materials science , annealing (glass) , sapphire , thermal stability , analytical chemistry (journal) , thin film , differential thermal analysis , atmospheric temperature range , diffraction , x ray crystallography , mineralogy , nanotechnology , optics , composite material , chemistry , physics , laser , chromatography , meteorology , organic chemistry
(Lu 1– x Eu x ) 2 O 3 smooth, crack‐free, transparent films were prepared by the Pechini sol–gel method and a spin‐coating technique. Thermogravimetric analysis, differential thermal analysis and FITR spectroscopy were used to study the chemical processes during annealing of the films. Film structure, morphology and optical properties were investigated. X‐ray diffraction (XRD) analysis reveals the cubic phase of (Lu 1– x Eu x ) 2 O 3 films annealed in the 600–1000 °C temperature range. Smooth and crack‐free films with thicknesses of 250–1000 nm were obtained in the 600–800 °C temperature range. The thickness upper limit (1000 nm) of morphological stability of films (Lu 1– x Eu x ) 2 O 3 on sapphire substrates has been studied.