Premium
Growth imperfections in oriented grown KDP crystals by X‐ray topographic analysis
Author(s) -
DeGao Zhong,
Bing Teng,
ZhengHe Yu,
LinXiang He,
ShuHua Wang,
XueJun Jiang,
JiangTao Ma,
ShuJie Zhuang,
WanXia Huang
Publication year - 2012
Publication title -
crystal research and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0232-1300
DOI - 10.1002/crat.201200209
Subject(s) - synchrotron radiation , crystallography , materials science , crystal growth , diffraction , dislocation , x ray , crystal (programming language) , synchrotron , x ray crystallography , optics , chemistry , physics , programming language , computer science
Potassium dihydrogen phosphate (KDP) crystals were restrained to grow in two dimensions only, using a specially designed platform. This enables us to grow the blanks of frequency conversion elements that satisfy type‐II phase matching direction out of a type‐II phase‐matched seed crystal. Synchrotron radiation topography was used to study the growth mechanism of these profiling grown KDP crystals. It is found that both dislocation growth mechanism and layer growth mechanism were involved in the growing process. Inclusions, growth striations and dislocations were the main defects that influenced the crystalline quality of these crystals. High‐resolution X‐ray diffraction was employed to study the lattice integrality of the crystal.