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Induced growth of Pb 0.97 La 0.02 (Zr 0.66 Sn 0.27 Ti 0.07 )O 3 antiferroelectric single crystals with a platinum wire
Author(s) -
Yang Zi,
Li Qiang,
Li Yuanyuan,
Wang Lin
Publication year - 2012
Publication title -
crystal research and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0232-1300
DOI - 10.1002/crat.201200179
Subject(s) - tetragonal crystal system , materials science , dielectric , phase boundary , ferroelectricity , antiferroelectricity , flux method , crystal (programming language) , phase (matter) , crystallography , analytical chemistry (journal) , titanate , single crystal , crystal structure , ceramic , chemistry , optoelectronics , organic chemistry , chromatography , computer science , programming language , composite material
Relaxor antiferroelectric (Pb,La)(Zr,Sn,Ti)O 3 (PLZST) with the composition near the morphotropic phase boundary shows excellent electrical properties. However, the crystal growth of PLZST is limited by the incongruent melting of the materials. Crystal growth of PLZST was induced by a platinum wire in the flux solution with 50 wt% PbO‐PbF 2 ‐B 2 O 3 as a solvent. The obtained PLZST single crystals are optical transparent with light yellow color. The size of the crystals in regular rectangular shape varies from 0.5 mm to 1 mm. The PLZST single crystals exhibit tetragonal phase structure. The element contents of the crystals were measured by inductively coupled plasma atomic emission spectrometry. The results show that the composition of as‐grown crystals is a little bit deviated from the starting composition. The single crystals show two dielectric peaks at 115 °C and 182 °C, corresponding to antiferroelectric‐ferroelectric and ferroelectric‐paraelectric phase transitions. The dielectric data of as‐grown crystals indicate there is typical relaxor behavior near 182 °C. The value of relaxor factor n is 1.49642.