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Initial growth of Bi 4 LaTi 3 FeO 15 thin films on SrTiO 3 , MgO and YSZ substrates
Author(s) -
Wu FeiXiang,
Ji WeiJing,
Zhou Jian,
Chen Y. B.,
Yao ShuHua,
Zhang ShanTao,
Chen YanFeng
Publication year - 2012
Publication title -
crystal research and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0232-1300
DOI - 10.1002/crat.201200125
Subject(s) - aurivillius , materials science , crystallite , epitaxy , surface roughness , microstructure , thin film , surface finish , crystallography , crystal structure , yttria stabilized zirconia , mineralogy , nanotechnology , composite material , metallurgy , ceramic , chemistry , ferroelectricity , optoelectronics , cubic zirconia , layer (electronics) , dielectric
The initial growth modes of Bi 4 LaTi 3 FeO 15 thin films on (001) SrTiO 3 , (001) MgO and (001) Y:ZrO 2 (YSZ) substrates are studied. Detailed crystal structure, microstructure and surface morphology characterizations substantiate that Bi 4 LaTi 3 FeO 15 films grow on these substrates via three‐dimensional grain growth mode. The synthesized Bi 4 LaTi 3 FeO 15 films on (001) MgO and (001) SrTiO 3 substrates do have c‐axis epitaxial Aurivillius layered structure, and have relative smooth surface roughness. While films grown on (001) YSZ show the polycrystalline quality with large surface roughness. The different crystal quality of films grown on MgO/SrTiO 3 and YSZ substrates is explained qualitatively by considering the different atomic surface structures of these substrates.