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Comparison of radiation detector performance for different metal contacts on CdZnTe deposited by electroless deposition method
Author(s) -
Zheng Q.,
Dierre F.,
Ayoub M.,
Crocco J.,
Bensalah H.,
Corregidor V.,
Alves E.,
FernandezRuiz R.,
Perez J. M.,
Dieguez E.
Publication year - 2011
Publication title -
crystal research and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0232-1300
DOI - 10.1002/crat.201100268
Subject(s) - rhodium , ohmic contact , rutherford backscattering spectrometry , platinum , full width at half maximum , analytical chemistry (journal) , deposition (geology) , metal , materials science , chemistry , ruthenium , radiochemistry , thin film , layer (electronics) , optoelectronics , metallurgy , nanotechnology , paleontology , biochemistry , chromatography , sediment , biology , catalysis
A comparative study of four different metals gold (Au), platinum (Pt), ruthenium (Ru) and rhodium (Rh) deposited on CdZnTe(CZT) by the electroless deposition method has been carried out. Two of these materials, Ru and Rh, have been deposited for the first time by this method. In contrast to the Pt deposition, the deposition of Ru and Rh were not carried out under the optimal conditions. The metals deposited on the samples were identified by Total reflection X‐ray Fluorescence (TXRF). Rutherford Backscattering Spectrometry (RBS) analyses show that Au forms the thickest layer (∼160 nm) for the experimental conditions of this work. Current‐voltage measurements show that Pt forms a more linear ohmic contact with the lowest leakage current. A 57 Co gamma ray spectrum gave a better detector performance with a FWHM 11 keV at 122 keV. (© 2011 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)