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Synthesis and characterization of manganese sulphide thin films deposited by spray pyrolysis
Author(s) -
Chowdhury M. R. I.,
Podder J.,
Islam A. B. M. O.
Publication year - 2011
Publication title -
crystal research and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0232-1300
DOI - 10.1002/crat.201000549
Subject(s) - thin film , scanning electron microscope , materials science , amorphous solid , analytical chemistry (journal) , band gap , absorbance , energy dispersive x ray spectroscopy , spectroscopy , substrate (aquarium) , manganese , optics , chemistry , nanotechnology , optoelectronics , crystallography , metallurgy , composite material , physics , oceanography , chromatography , quantum mechanics , geology
Manganese sulphide (MnS) thin films have been deposited onto glass substrate by a low cost spray‐pyrolysis technique at 220 °C. The as‐deposited MnS thin films have been characterized using scanning electron microscopy (SEM), energy dispersive X‐ray (EDX) spectroscopy, atomic force microscopy (AFM), X‐ray diffraction, UV visible spectroscopy and photo electrochemical (PEC) measurement. The SEM and AFM images showed that the MnS thin films were well covered onto the substrate surface. The as‐deposited raw thin film was found to be amorphous in nature and perfectly crystalline phase after annealing the sample. Optical band gap of the MnS thin films was found to vary from 3.1 to 3.21 eV and the band gap decreases with the increase in film thickness. Optical constants such as refractive index, extinction coefficient have been evaluated using reflectance and absorbance data. (© 2011 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)