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Temperature dependence of photoluminescence from ordered GaInP 2 epitaxial layers
Author(s) -
Prutskij T.,
Pelosi C.
Publication year - 2010
Publication title -
crystal research and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0232-1300
DOI - 10.1002/crat.200900418
Subject(s) - photoluminescence , atmospheric temperature range , quenching (fluorescence) , intensity (physics) , epitaxy , materials science , spontaneous emission , full width at half maximum , recombination , emission intensity , condensed matter physics , luminescence , layer (electronics) , molecular physics , chemistry , optoelectronics , optics , laser , nanotechnology , physics , fluorescence , thermodynamics , biochemistry , gene
The temperature behavior of the integrated intensity of photoluminescence (PL) emission from ordered GaInP 2 epitaxial layer was measured at temperatures of 10 ‐ 300 K. Within this temperature range the PL emission is dominated by band‐to‐band radiative recombination. The PL intensity temperature dependence has two regions: at low temperatures it quenches rapidly as the temperature increases, and above 100 K it reduces slowly. This temperature behavior is compared with that of disordered GaInP 2 layer. The specter of the PL emission of the disordered layer has two peaks, which are identified as due to donor‐accepter (D‐A) and band‐to‐band recombination. The PL intensity quenching of these spectral bands is very different: With increasing temperature, the D‐A peak intensity remains almost unchanged at low temperatures and then decreases at a higher rate. The intensity of the band‐to‐band recombination peak decays gradually, having a higher rate at low temperatures than at higher temperatures. Comparing these temperature dependencies of these PL peaks of ordered and disordered alloys and the temperature behavior of their full width at half maximum (FWHM), we conclude that the different morphology of these alloys causes their different temperature behavior. (© 2010 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)