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Flux growth and characterization of Ti‐ and Ni‐doped forsterite single crystals
Author(s) -
Bloise A.,
Barrese E.,
Apollaro C.,
Miriello D.
Publication year - 2009
Publication title -
crystal research and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0232-1300
DOI - 10.1002/crat.200800604
Subject(s) - forsterite , differential scanning calorimetry , doping , scanning electron microscope , materials science , flux (metallurgy) , crystal (programming language) , crystal growth , analytical chemistry (journal) , crystallography , powder diffraction , diffraction , mineralogy , chemistry , metallurgy , thermodynamics , optics , composite material , physics , optoelectronics , chromatography , computer science , programming language
Forsterite monocrystals doped with Ti and Ni were grown by the flux growth technique. A suitable mixture of flux (MoO 3 , V 2 O 5 , Li 2 CO 3 ) and nutrient was slowly cooled down to 750 °C from 1250 °C or 1350 °C. The crystals were then characterized by powder and single‐crystal X‐ray diffraction, scanning electron microscopy and differential scanning calorimetry (DSC). Variations observed in crystal size were attributed by both the varying experimental conditions in which they had been obtained, and to the amount of Ni substituted for Mg in the structure. High abundances of doped forsterite required a cooling rate of 1.8 K h ‐1 . These synthetic, well‐characterized Ti and Ni doped forsterite crystals may have potential for exploitation in industrial fields. (© 2009 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)