Structural study of the semimagnetic semiconductor Zn 0.5 Mn 0.5 In 2 Te 4 | Zendy

Delgado G. E. | Zendy; Sagredo V. | Zendy

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Structural study of the semimagnetic semiconductor Zn 0.5 Mn 0.5 In 2 Te 4

Author(s) -

Delgado G. E.,

Sagredo V.

Publication year - 2009

Publication title -

crystal research and technology

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.377

H-Index - 64

eISSN - 1521-4079

pISSN - 0232-1300

DOI - 10.1002/crat.200800089

Subject(s) - crystallography , semiconductor , rietveld refinement , semiconductor materials , compound semiconductor , crystal structure , chemistry , x ray crystallography , alloy , diffraction , space group , materials science , analytical chemistry (journal) , nanotechnology , physics , metallurgy , optoelectronics , optics , epitaxy , layer (electronics) , chromatography

The semimagnetic semiconductor alloy Zn 0.5 Mn 0.5 In 2 Te 4 was refined from an X‐ray powder diffraction pattern using the Rietveld method. This compound crystallizes in the space group I42m (Nº 121), Z = 2, with unit cell parameters a = 6.1738(1) Å, c = 12.3572(4) Å, V = 471.00(2) Å3, c / a = 2.00. This material crystallizes in a stannite‐type structure. (© 2009 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)

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