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Structural study of the semimagnetic semiconductor Zn 0.5 Mn 0.5 In 2 Te 4
Author(s) -
Delgado G. E.,
Sagredo V.
Publication year - 2009
Publication title -
crystal research and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0232-1300
DOI - 10.1002/crat.200800089
Subject(s) - crystallography , semiconductor , rietveld refinement , semiconductor materials , compound semiconductor , crystal structure , chemistry , x ray crystallography , alloy , diffraction , space group , materials science , analytical chemistry (journal) , nanotechnology , physics , metallurgy , optoelectronics , optics , epitaxy , layer (electronics) , chromatography
The semimagnetic semiconductor alloy Zn 0.5 Mn 0.5 In 2 Te 4 was refined from an X‐ray powder diffraction pattern using the Rietveld method. This compound crystallizes in the space group I42m (Nº 121), Z = 2, with unit cell parameters a = 6.1738(1) Å, c = 12.3572(4) Å, V = 471.00(2) Å3, c / a = 2.00. This material crystallizes in a stannite‐type structure. (© 2009 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)