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Investigation of structural perfection and faceting in highly Er‐doped Yb 3 Al 5 O 12 crystals
Author(s) -
Kolodziejak K.,
Wierzchowski W.,
Wieteska K.,
Malinowski M.,
Graeff W.,
Lukasiewicz T.
Publication year - 2008
Publication title -
crystal research and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0232-1300
DOI - 10.1002/crat.200711099
Subject(s) - synchrotron , materials science , crystallography , faceting , optics , diffraction , doping , optoelectronics , chemistry , physics
The undoped Yb 3 Al 5 O 12 (YbAG) single crystals and doped with 1.5, 10 and 30 at% erbium were grown by the Czochralski method. The YbAG crystals offer efficient emission of laser beam of 2.94 µm and 1.55 µm important for practical applications in communication and medicine. The crystals were investigated by various synchrotron X‐ray diffraction methods including white beam topographic methods, monochromatic beam topography and recording of the rocking curves. The experiments were performed at E2 and F1 experimental stations in HASYLAB. The investigations proved a good crystallographic perfection of the crystals, in most cases revealing only segregation fringes and growth facets. The crystallographic identification of the facets was performed together with direct evaluation of growth front radius from the transmission section topographs. Relative lattice parameter changes connected with erbium segregation were found to be less than 2 × 10 ‐5 inside the segregation fringes and 8 × 10 ‐5 in the facets. (© 2008 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)