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Structural, optical and electrical characterization of Hg x Cd 1‐x Te polycrystalline films fabricated by two‐source evaporation technique
Author(s) -
Basharat M.,
Hannan M. A.,
Shah N. A.,
Ali A.,
Arif M.,
Maqsood A.
Publication year - 2007
Publication title -
crystal research and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0232-1300
DOI - 10.1002/crat.200710911
Subject(s) - crystallite , band gap , thin film , analytical chemistry (journal) , electrical resistivity and conductivity , transmittance , materials science , evaporation , absorption (acoustics) , characterization (materials science) , optics , chemistry , optoelectronics , nanotechnology , composite material , metallurgy , physics , engineering , chromatography , electrical engineering , thermodynamics
Two‐source thermal evaporation technique was used to prepare Hg x Cd 1‐x Te thin films onto scratch free transparent glass substrates. The structural investigations revealed that thin films were polycrystalline in nature. Transmittance measurements in the wavelength range (500‐2700 nm) were used to calculate optical constants. The analysis of the optical absorption data showed that the optical band gap was of indirect type. In the composition range 0.05 < x < 0.25 the films exhibited an optical band gap between 1.29 and 0.98 eV. In the same composition range the films were p‐type and exhibited a resistivity, which varied between 10 2 and 10 ‐1 Ω‐cm. (© 2007 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)