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Growth and characterisation of Zn:LiNbO 3 /Mg:LiNbO 3 multilayer thin films grown by liquid phase epitaxy
Author(s) -
Lee H. J.,
Shin T. I.,
Shur J. W.,
Yoon D. H.
Publication year - 2006
Publication title -
crystal research and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0232-1300
DOI - 10.1002/crat.200510682
Subject(s) - electron microprobe , crystallinity , epitaxy , thin film , doping , transmission electron microscopy , materials science , analytical chemistry (journal) , substrate (aquarium) , phase (matter) , scanning electron microscope , chemistry , optoelectronics , nanotechnology , composite material , layer (electronics) , metallurgy , oceanography , organic chemistry , chromatography , geology
1, 3 and 5 mol% ZnO doped LiNbO 3 film and 2 mol% MgO doped LiNbO 3 multilayer films were grown on the LiNbO 3 (001) substrate by liquid phase epitaxy (LPE) method with a Li 2 O‐V 2 O 5 system. We examined the optical transmission spectra of the Zn:LiNbO 3 by Fourier Transform‐Infrared Spectrophotometer (FT‐IR). The crystallinity and the lattice mismatch between the Zn:LiNbO 3 film and Mg:LiNbO 3 film was confirmed by x‐ray rocking curve (XRC) and observed the ZnO and MgO distribution in the cross‐section of the multilayer thin films by electron probe micro analyzer (EPMA). Furthermore, the surface morphology of the films was observed using atomic force microscopy (AFM). (© 2006 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)