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Transmission electron microscopy and Rutherford backscattering spectrometry studies of Ag 2 Te films formed from Ag‐Te thin film couples
Author(s) -
Mohanty B. C.,
Kasiviswanathan S.
Publication year - 2006
Publication title -
crystal research and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0232-1300
DOI - 10.1002/crat.200410530
Subject(s) - rutherford backscattering spectrometry , monoclinic crystal system , transmission electron microscopy , crystallite , thin film , analytical chemistry (journal) , orthorhombic crystal system , annealing (glass) , stoichiometry , materials science , spinodal decomposition , crystallography , chemistry , phase (matter) , crystal structure , nanotechnology , metallurgy , organic chemistry , chromatography
Formation of Ag 2 Te thin films from room temperature (300 K) solid state reaction of Ag and Te thin film couples is investigated. Rutherford Backscattering Spectrometry (RBS) studies confirmed the complete miscibility of the couples and the stoichiometry of the resulting Ag 2 Te. Structural analysis by Transmission Electron Microscopy (TEM) showed a fine‐grained structure with monoclinic and orthorhombic phases. Annealing at high temperatures resulted in the growth of giant crystallites with monoclinic phase at random sites. (© 2005 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)