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Growth behaviour of bulk GaN single crystals grown with various flux ratios using solvent‐thermal method
Author(s) -
Shin T. I.,
Yoon D. H.
Publication year - 2005
Publication title -
crystal research and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0232-1300
DOI - 10.1002/crat.200410441
Subject(s) - wurtzite crystal structure , flux (metallurgy) , nucleation , raman spectroscopy , materials science , flux method , analytical chemistry (journal) , crucible (geodemography) , crystal (programming language) , microanalysis , single crystal , mole fraction , crystal growth , crystallography , chemistry , optics , zinc , metallurgy , programming language , physics , computational chemistry , organic chemistry , chromatography , computer science
Bulk GaN single crystals were grown using a solvent‐thermal method. They were grown for 200 h at 600 °C and 800 °C using 8 MPa of N 2 gas and 1–3 mm sized pyramid GaN single crystals. Pure Na, NaN 3 and Ca were used as the flux. The mole fraction of the [flux]/([flux] + [Ga]) was 0.30–0.67. The growth behavior differed according to the flux ratio. The quality of the bulk GaN single crystals was improved by increasing the flux ratio. The bulk GaN single crystals formed by spontaneous nucleation were deposited on the BN crucible wall and bottom during the first step of synthesis. The wurtzite structure of the GaN grown single crystal was confirmed by x‐ray diffration. The chemical composition was analyzed by electron probe microanalysis. The quality and optical properties of the GaN single crystal were examined by Raman spectroscopy and photoluminesence analysis. (© 2005 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)