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X‐ray photoelectron spectroscopy investigations of Y 3 Al 5 O 12 :Yb single crystal
Author(s) -
Kruczek M.,
Talik E.,
Sakowska H.,
Gała M.,
Świrkowicz M.
Publication year - 2005
Publication title -
crystal research and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0232-1300
DOI - 10.1002/crat.200410363
Subject(s) - x ray photoelectron spectroscopy , valence (chemistry) , chemical state , dopant , analytical chemistry (journal) , ionic bonding , chemical bond , single crystal , x ray spectroscopy , spectroscopy , x ray , chemistry , oxygen , chemical composition , aluminium , doping , crystallography , materials science , ion , nuclear magnetic resonance , physics , optoelectronics , organic chemistry , chromatography , quantum mechanics
X‐ray photoelectron spectroscopy was used to study the chemical composition and electronic structure of the Y 3 Al 5 O 12 :Yb (YAG:Yb) crystals. The contamination of the crystal with carbon and oxygen in the broken under UHV sample was found. The dopant concentration of Yb, in the mixed valence state, was determined as 12 %. The aluminium concentration is lower than a nominal value. The chemical shift analysis shows more ionic bond of Y‐O than Al‐O. (© 2005 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)