X‐ray powder diffraction study of the semiconducting alloy Cu 2 Cd 0.5 Mn 0.5 GeSe 4 | Zendy

Delgado G. E. | Zendy; Quintero E. | Zendy; Tovar R. | Zendy; Quintero M. | Zendy

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X‐ray powder diffraction study of the semiconducting alloy Cu 2 Cd 0.5 Mn 0.5 GeSe 4

Author(s) -

Delgado G. E.,

Quintero E.,

Tovar R.,

Quintero M.

Publication year - 2004

Publication title -

crystal research and technology

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.377

H-Index - 64

eISSN - 1521-4079

pISSN - 0232-1300

DOI - 10.1002/crat.200310257

Subject(s) - crystallography , alloy , diffraction , x ray crystallography , rietveld refinement , materials science , powder diffraction , x ray , crystal structure , angstrom , chemistry , optics , metallurgy , physics

The structure of the semiconducting alloy Cu 2 Cd 0.5 Mn 0.5 GeSe 4 was refined from an X‐ray powder diffraction pattern using the Rietveld method. The present alloy crystallizes in the wurtz‐stannite structure, space group Pmn2 1 (N o 31), and unit cell parameters values of a = 8.0253(2) Å, b = 6.8591(2) Å, c = 6.5734(2) Å and V = 361.84(2) Å 3 . The structure exhibits a three‐dimensional arrangement of slightly distorted CuSe 4 , Cd(Mn)Se 4 and GeSe 4 tetrahedras connected by corners. © 2004 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim

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