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Misleading fringes in TEM images and diffraction patterns of Si nanocrystallites
Author(s) -
Kohno Hideo,
Ozaki Nobuhiko,
Yoshida Hideto,
Tanaka Koji,
Takeda Seiji
Publication year - 2003
Publication title -
crystal research and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0232-1300
DOI - 10.1002/crat.200310140
Subject(s) - high resolution transmission electron microscopy , transmission electron microscopy , electron diffraction , diffraction , crystallography , reciprocal lattice , materials science , lattice (music) , reciprocal , selected area diffraction , optics , condensed matter physics , nanotechnology , chemistry , physics , acoustics , linguistics , philosophy
High‐resolution transmission electron microscopy (HRTEM) images and electron diffraction patterns of twinned Si nanocrystallites were recorded along various directions and analyzed in detail. We point out that special attention must be paid when interpreting HRTEM images and diffraction patterns of twinned Si nanocrystallites, because elongation of reciprocal lattice points could fabricate misleading fringes and patterns. (© 2003 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)