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Diffusion effects at the Au/p‐CuInSe 2 contact studied by XPS
Author(s) -
Neumann H.,
Yakushev M. V.,
Tomlinson R. D.
Publication year - 2003
Publication title -
crystal research and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0232-1300
DOI - 10.1002/crat.200310082
Subject(s) - x ray photoelectron spectroscopy , annealing (glass) , ohmic contact , alloy , diffusion , chemistry , contact resistance , materials science , analytical chemistry (journal) , metallurgy , chemical engineering , electrode , thermodynamics , physics , chromatography , engineering
X‐ray excited photoelectron spectroscopy (XPS) was used to investigate the reactions at the interface between Au and CuInSe 2 in case of Au/p‐CuInSe 2 contacts produced by a procedure usually used to prepare low resistance ohmic contacts. Formation of an In‐Au alloy is observed after an annealing step at 300 °C in a nonoxidising atmosphere. Furthermore, it is found that some amount of gold diffuses into the CuInSe 2 substrate. A tentative defect model is proposed to describe the formation mechanism of Au/ p‐CuInSe 2 contacts.