Diffusion effects at the Au/p‐CuInSe 2  contact studied by XPS | Zendy

Neumann H. | Zendy; Yakushev M. V. | Zendy; Tomlinson R. D. | Zendy

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Diffusion effects at the Au/p‐CuInSe 2 contact studied by XPS

Author(s) -

Neumann H.,

Yakushev M. V.,

Tomlinson R. D.

Publication year - 2003

Publication title -

crystal research and technology

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.377

H-Index - 64

eISSN - 1521-4079

pISSN - 0232-1300

DOI - 10.1002/crat.200310082

Subject(s) - x ray photoelectron spectroscopy , annealing (glass) , ohmic contact , alloy , diffusion , chemistry , contact resistance , materials science , analytical chemistry (journal) , metallurgy , chemical engineering , electrode , thermodynamics , physics , chromatography , engineering

X‐ray excited photoelectron spectroscopy (XPS) was used to investigate the reactions at the interface between Au and CuInSe 2 in case of Au/p‐CuInSe 2 contacts produced by a procedure usually used to prepare low resistance ohmic contacts. Formation of an In‐Au alloy is observed after an annealing step at 300 °C in a nonoxidising atmosphere. Furthermore, it is found that some amount of gold diffuses into the CuInSe 2 substrate. A tentative defect model is proposed to describe the formation mechanism of Au/ p‐CuInSe 2 contacts.

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