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Growth and TEM and HREM characterisation of TiC crystals grown from high‐temperature solutions
Author(s) -
Strzeciwilk D.,
Wokulski Z.,
Tkacz P.
Publication year - 2003
Publication title -
crystal research and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0232-1300
DOI - 10.1002/crat.200310032
Subject(s) - transmission electron microscopy , microstructure , materials science , crystallography , solvent , morphology (biology) , electron microscope , composite material , nanotechnology , chemistry , optics , organic chemistry , physics , biology , genetics
The results of TiC crystals and Ni microstructure studies by means of transmission electron microscope are presented. It was shown that Ni may be used as high temperature solvent for obtaining TiC crystals. This paper reports the results of morphology and growth of TiC crystals. The obtained TiC crystals with application of Ni as high temperature solvent were mainly of {001} cubic form, although irregular forms were also observed. Detailed TEM and HREM studies have shown that dislocations are formed in the vicinity of incoherent TiC precipitates in Ni matrices.