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B. K. Tanner, D. K. Bowen. Characterization of Crystal Growth Defects by X‐ray Methods. New York and London, publ. in cooperation with NATO Scientific Affairs Division 1980, 589 Seiten mit 364 Abbildungen und 26 Tabellen, Leinen Preis: US $ 65.00
Author(s) -
Paufler P.
Publication year - 1981
Publication title -
kristall und technik
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0023-4753
DOI - 10.1002/crat.19810161224
Subject(s) - characterization (materials science) , library science , citation , art history , art , nanotechnology , materials science , computer science