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Fast local stress measurement by the X‐ray microbeam diffraction technique using an annular proportional counter
Author(s) -
Stephan D.,
Richter K.
Publication year - 1981
Publication title -
kristall und technik
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0023-4753
DOI - 10.1002/crat.19810160517
Subject(s) - microbeam , physics , nuclear physics