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The detection of impurities on metallic surfaces by means of the electron energy loss spectroscopy
Author(s) -
Heyroth W.
Publication year - 1981
Publication title -
kristall und technik
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0023-4753
DOI - 10.1002/crat.19810160415
Subject(s) - electron , impurity , atomic physics , materials science , spectroscopy , plasmon , electron energy loss spectroscopy , excitation , monochromatic color , metal , electron excitation , crystal (programming language) , layer (electronics) , chemistry , optics , physics , optoelectronics , nanotechnology , quantum mechanics , computer science , metallurgy , programming language , organic chemistry
The energy analysis of backscattered low‐energy monochromatic electrons is used to investigate the appearances on crystal surfaces in the vacuum during thermal treatment. Up to 500 K hydrocarbons can be detected by electronic excitation. In the interval from 600 K to 1100 K the presence of a carbon‐contamination layer follows from the excitations of plasmons. The thickness of the layer influences the ratio of the elastically and inelastically backscattered electrons. The material analysis of the clean surfaces due to temperatures above 1200 K is performed by the excitations of the upper inner atomic shells.