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X‐ray and X‐ray photoelectron spectra of vanadium oxides
Author(s) -
Werfel F.,
Dräger G.,
Berg U.
Publication year - 1981
Publication title -
kristall und technik
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0023-4753
DOI - 10.1002/crat.19810160126
Subject(s) - x ray photoelectron spectroscopy , vanadium , valence (chemistry) , oxidation state , spectral line , x ray , electronic structure , chemical state , chemistry , vanadium oxide , analytical chemistry (journal) , materials science , inorganic chemistry , metal , nuclear magnetic resonance , computational chemistry , physics , optics , organic chemistry , chromatography , astronomy
X‐ray (XS) and X‐ray photoelectron (XPS) spectra are reported for vanadium oxides. Because of the multivalent character of vanadium in the oxide system high quality measurements can be used for chemical shift investigation. Both inner level and valence band spectroscopy give information on the electronic structure and their systematic change with increasing oxidation state. The experimental results are discussed favourable in terms of molecular orbital theory (MO‐theory). The complete set of XS and XPS data reported here for V‐oxides allows the identification of unknown vanadium oxidation states too.