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The role of contamination layers in electron probe microanalysis
Author(s) -
Wendt M.
Publication year - 1980
Publication title -
kristall und technik
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0023-4753
DOI - 10.1002/crat.19800151206
Subject(s) - contamination , chemistry , materials science , environmental chemistry , biology , ecology
After a brief description of the mechanism of the contamination layer build‐up the following topics are discussed: atomic number dependence of the contamination rate, composition of contamination layers, X‐ray intensity loss caused by a contamination layer, special problems in energy dispersive analysis, useful aspects of specimen contamination.