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Internal defect structures of olivine crystals
Author(s) -
Inoue T.,
Komatsu H.,
Takei H.,
Ozima M.,
Shimizu M.
Publication year - 1980
Publication title -
kristall und technik
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0023-4753
DOI - 10.1002/crat.19800151111
Subject(s) - forsterite , olivine , dislocation , impurity , scattering , crystallography , dislocation creep , materials science , mineralogy , flux (metallurgy) , geology , condensed matter physics , optics , metallurgy , chemistry , physics , organic chemistry
Defect structures of olivine crystals (Czochralski grown forsterite, flux grown forsterite and natural olivine) were studied by means of chemical etching method, X‐ray topography and light scattering tomography. Two etchants were used for revealing the dislocation sites; one is the etchant described by W EGNER , C HRISTIE , another is that by D ESAI , J OHN . It was found that great care was needed in identifying dislocation sites using these etchants since they attack the impurity sites as well as dislocation sites. The results obtained are as follows; (1) The Czochralski grown forsterite and flux grown forsterite were free from sub‐boundaries and the dislocation density was smaller than that of a natural olivine. There existed many sub‐boundaries in the natural olivine. (2) X‐ray topographic study showed that (i) the dislocation lines of the Czochralski grown forsterite consisted mainly of straight segments nearly parallel to the low index direction, whereas (ii) no dislocation lines corresponding to the etch pits were observed in the flux grown forsterite. (3) The study by light scattering tomography showed that there existed various types of scattering centers in these olivine crystals and that the density and shape were different among them.