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Stress measurements in aluminium alloy films by the sin 2 ψ method
Author(s) -
Skladnikiwitz S.
Publication year - 1980
Publication title -
kristall und technik
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0023-4753
DOI - 10.1002/crat.19800150809
Subject(s) - materials science , aluminium , alloy , homogeneous , thermal expansion , creep , composite material , lattice (music) , substrate (aquarium) , texture (cosmology) , metallurgy , aluminium alloy , thermal , thermodynamics , oceanography , physics , image (mathematics) , artificial intelligence , computer science , acoustics , geology
The lattice parameters and the homogeneous elastic stresses in evaporated Al, AlSi and AlCu films 1 μm in thickness with, in part, a high degree of fibre texture have been determined. The stresses measured at room temperature as a function of the substrate temperature can be explained by the difference in the coefficients of thermal expansion between film and substrate in connection with creep processes. The different lattice parameters of the films as compared with bulk aluminium were found to be due to homogeneous elastic stresses and alloying elements.