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Perspective fields of application of texture topography and further development of its apparatus
Author(s) -
Born E.,
Schwarzbauer H.
Publication year - 1980
Publication title -
kristall und technik
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0023-4753
DOI - 10.1002/crat.19800150716
Subject(s) - perspective (graphical) , optics , point (geometry) , diaphragm (acoustics) , texture (cosmology) , surface (topology) , diffraction , development (topology) , physics , materials science , computer science , mathematics , geometry , image (mathematics) , artificial intelligence , acoustics , mathematical analysis , vibration
The applications of a new X‐ray topography method designed for investigations of polycrystalline samples are closely related to reasons of different X‐ray reflectivity from point to point in the surface of the specimen. The discussion of these relationships is followed by suggestions for an apparatus. The most simple one is based on the principle of the “camera obscura” locating the diaphragm of the camera at the place where a diffracted beam is focussed either according to the focussing principle of Guinier or according to Bragg‐Brentano, respectively.