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Real structure investigations of LiNbO 3 single crystals grown by the flux method
Author(s) -
Hemmerling J.,
Hergt R.
Publication year - 1980
Publication title -
kristall und technik
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0023-4753
DOI - 10.1002/crat.19800150708
Subject(s) - dislocation , impurity , materials science , flux (metallurgy) , czochralski method , crystallography , etching (microfabrication) , ion , flux method , crystal growth , optics , condensed matter physics , chemistry , nanotechnology , composite material , single crystal , metallurgy , physics , organic chemistry , layer (electronics)
The real structure of flux grown LiNbO 3 crystals is investigated by etching technique, X‐ray topography, and optical polariscopic method. The main defects are microdomains, dislocations and minor impurities of V 3+ −ions. The crystals do not contain growth striations. The mean dislocation density is in the order of 10 3 cm −2 . The main origin of the defects seems to be post‐growth mechanical stress. The results are discussed in comparison to the real structure typically found in the case of Czochralski crystals.