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Defect generation in LPE garnet films during annealing
Author(s) -
Hergt R.
Publication year - 1980
Publication title -
kristall und technik
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0023-4753
DOI - 10.1002/crat.19800150608
Subject(s) - annealing (glass) , materials science , dislocation , crystallographic defect , scanning electron microscope , stress relaxation , condensed matter physics , crystallography , optics , composite material , chemistry , physics , creep
The defects induced in LPE garnet films during annealing processes near 1300°C were investigated by X‐ray topography, etching, scanning electron microscopy and Nomarski interference microscopy. The results show that besides loops and more complicated dislocation configurations point defects play an essential role for the stress relaxation mechanism in the film. The observed coarsening effects on the film surface are due to the high surface free energy of {111} faces on garnets. A consistent explanation of the various experimental observations is given by assuming the creation of oxygen vacancies during annealing.