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Properties of oriented TTF‐TCNQ thin films
Author(s) -
Reinhardt C.,
Vollmann W.,
Hamann C.,
Libera L.,
Trompler S.
Publication year - 1980
Publication title -
kristall und technik
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0023-4753
DOI - 10.1002/crat.19800150223
Subject(s) - thin film , materials science , electrical resistivity and conductivity , substrate (aquarium) , morphology (biology) , deposition (geology) , chemical vapor deposition , conductivity , crystallography , nanotechnology , chemistry , paleontology , oceanography , sediment , biology , electrical engineering , genetics , engineering , geology
Vapour deposited thin films of the organic molecular complex tetrathiafulvaliniumtetracyanoquinodimethane (TTF‐TCNQ) are investigated by electrical and electronmicroscopical methods. Morphology studies by means of electron micrographs show, that the thin films up to thicknesses of 300 nm consist of small crystals of a size of 1.2 · 0.2 μm 2 (deposited on cleaved (100) faces of NaCl) or 15 · 2 μm 2 (on glass substrate). Dependend on deposition conditions and on material of the substrate thin films are produced with strong or statistic orientation of this crystals. Strong oriented thin films exhibit conductivities up to σ = 65 ω −1 cm −1 and activation energies of W A = 0.02 eV. The found dependences of the conductivity on electrical field strength. temperature, and size of microcrystals are explained by a linear hopping model.