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Determination of the crystallite size in epitaxial layers of PbTe by means of X‐ray diffraction rocking curves
Author(s) -
Schäfer P.,
Berger H.
Publication year - 1979
Publication title -
kristall und technik
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0023-4753
DOI - 10.1002/crat.19790140614
Subject(s) - crystallite , epitaxy , diffraction , materials science , crystallography , lattice (music) , x ray , dimension (graph theory) , condensed matter physics , x ray crystallography , optics , physics , chemistry , nanotechnology , mathematics , layer (electronics) , acoustics , pure mathematics
To prove the influence of the crystallite size (dimension of coherent regions parallel to the reflecting lattice planes) on the rocking curve of single crystals, half widths measured on epitaxial layers of PbTe have been evaluated. It results from statistical analysis of the data that there exist a significant influence of the crystallite size. The crystallite sizes have been calculated from these data using two simple models. The values have orders of magnitude as expected and agree with data from electron microscopy. The method as described here can be applied in suitable cases to get an additional parameter for characterizing the structural perfection.