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Comparison of X‐ray topographical images in implanted silicon crystals at different absorption conditions
Author(s) -
Furmanik Z.,
Hubrig H.,
Maciaszek M.,
Vassilev I. S.
Publication year - 1979
Publication title -
kristall und technik
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0023-4753
DOI - 10.1002/crat.19790140312
Subject(s) - bulgarian , library science , engineering physics , citation , physics , philosophy , computer science , linguistics
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