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Kinetics of etching of dislocations in magnesium orthosilicate single crystals
Author(s) -
Desai C. C.,
John V.
Publication year - 1979
Publication title -
kristall und technik
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0023-4753
DOI - 10.1002/crat.19790140110
Subject(s) - activation energy , dissolution , dislocation , magnesium , hydrochloric acid , materials science , crystal (programming language) , etching (microfabrication) , doping , impurity , crystallography , kinetics , orthosilicate , manganese , crystal growth , analytical chemistry (journal) , mineralogy , chemistry , metallurgy , composite material , nanotechnology , physics , optoelectronics , organic chemistry , layer (electronics) , quantum mechanics , chromatography , computer science , programming language , tetraethyl orthosilicate
Cleavages of undoped, doped and natural magnesium orthosilicate crystals have been simultaneously etched in concentrated hydrochloric acid solution. The lateral and normal velocities of the growth of pits were then measured at different temperatures for the varieties of crystals. The time dependence of the growth of pit dimensions is found to be linear, while the temperature dependence of the growth of pits is found to be exponential, viz. V = A exp (− E / kT ). The dissolution parameters, e. g. the activation energy ( E ) and the pre‐exponential factor ( A ) for dissolution along the surface and along the dislocation lines have been computed. It is observed that: (1) the activation energy ( E 1 ) of dissolution along [001] direction is found to be greater than the activation energy ( E b ) along [100] direction, irrespective of whether the crystals are doped, undoped or natural, and (2) the doping of the crystal with manganese has lowered down the activation energy ( E d ) to such an extent that it is less than E 1 and E b . The implications are discussed.