Premium
Investigations of crystal defects with reflection‐section topography
Author(s) -
Zaumseil P.
Publication year - 1978
Publication title -
kristall und technik
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0023-4753
DOI - 10.1002/crat.19780130814
Subject(s) - reflection (computer programming) , section (typography) , crystal (programming language) , optics , lattice (music) , materials science , interference (communication) , laser , geometry , physics , channel (broadcasting) , mathematics , computer science , acoustics , computer network , programming language , operating system
Abstract A simple topographic technique is presented that allows an exact determination of the depth of kinematically reflecting regions below the crystal surface. A kinematical reflection full of contrast can be achieved by a spatial separation of the images from perfect and disturbed parts of the crystal. Possible applications of reflection‐section topography are e.g. demonstrated by lattice deformations caused by laser irradiation and ion implantation as well as by growth bands and dislocations. In weakly deformed crystals a new kind of interference fringes can be observed.