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On the profile of X‐ray diffraction lines in GUINIER powder diagrams
Author(s) -
FichtnerSchmittler H.,
Menz M.L.
Publication year - 1978
Publication title -
kristall und technik
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0023-4753
DOI - 10.1002/crat.19780130518
Subject(s) - powder diffraction , diffraction , x ray , basis (linear algebra) , materials science , interference (communication) , optics , x ray crystallography , crystallography , analytical chemistry (journal) , physics , geometry , chemistry , computer science , mathematics , chromatography , computer network , channel (broadcasting)
Structure research or quantitative phase analysis on the basis of X‐ray powder data often require a knowledge of the profile of diffraction peaks. From an experimental investigation of interference lines obtained with a Jagodzinski‐type Guinier camera a satisfactory description of the profiles and the angular dependence of half‐widths have been derived. The empirical functions obtained are compared with those used by other authors.