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New model of the bond diffractometer for precise determination of lattice parameters and thermal expansion of single crystals
Author(s) -
Łukaszewicz K.,
Kucharczyk D.,
Malinowski M.,
Pietraszko A.
Publication year - 1978
Publication title -
kristall und technik
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0023-4753
DOI - 10.1002/crat.19780130516
Subject(s) - diffractometer , thermal expansion , lattice (music) , materials science , thermal , thermal stability , phase transition , crystallography , atmospheric temperature range , solid state , thermodynamics , crystal structure , chemistry , physics , composite material , organic chemistry , acoustics
A new model of diffractometer for very precise measurements (1 ppm accuracy) of lattice parameters and thermal expansion is presented. Special attention is paid to the temperature control and stability in a wide range from liquid nitrogen up to 800 K. Two examples of the application of the diffractometer in a study of solid state phase transitions are given.