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Spectroscopy of Rare‐Earth Elements in Single‐Crystal Films of Yttrium‐Aluminium Garnets (YAG)
Author(s) -
Arsenev P. A.,
Bagdasarov Kh. S.,
Fenin V. V.
Publication year - 1978
Publication title -
kristall und technik
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0023-4753
DOI - 10.1002/crat.19780130111
Subject(s) - yttrium , materials science , erbium , aluminium , substrate (aquarium) , epitaxy , analytical chemistry (journal) , rare earth , thin film , spectroscopy , crystal (programming language) , ion , yttrium aluminium garnet , doping , mineralogy , metallurgy , chemistry , nanotechnology , optoelectronics , oceanography , physics , organic chemistry , layer (electronics) , chromatography , quantum mechanics , computer science , programming language , geology , oxide
Abstract The utilization of liquid‐phase epitaxy for growing thin yttrium‐aluminium garnet films is discussed. By transfer method from lead solvents films were obtained with a composition Y 3 Al 5 O 12 : Nd 3+ on substrates with composition Y 3 Al 5 O 12 , and films Y 3 Al 5 O 12 : Er 3+ , Y 3 Al 5 O 12 : Er 3+ , Ga 3+ (about 40 wt% of erbium) on substrates Y 3 Al 5 O 12 : Nd 3+ Characteristics are given for simultaneous induced emission generation of the system film‐substrate at 77 K Er 3+ ion (λ gen = 1.6602 μ) being a component of the film, and Nd 3+ ion, being a component of the substrate (λ gen = 1.061 μm). The results obtained are discussed.