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On the measurements of lattice parameters of semiconductor thin films
Author(s) -
Dogil B.,
Horodecki A. J.,
Precht W.
Publication year - 1977
Publication title -
kristall und technik
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0023-4753
DOI - 10.1002/crat.19770121214
Subject(s) - citation , computer science , physics , library science